Test Generation for Maximal Crosstalk Effect

As the feature size continues to scale into the nanometer era,crosstalk-induced effect begins to exert a more significant influence and might cause a failure．We proposed a novel test generation method based on multiple crosstalk-induced glitch fault model （MCGF）．This method can model the fault and generate proper patterns．In order to find the test activating aggressors as many as possible,we first map the objective of test generation into a weighted Max-SAT problem,and then solve it by using SAT solver to get required patterns．The sub-path constraints are added into the SAT problem to ensure that all activated aggressors switch simultaneously at the time the victim switches． Experiments on ISCAS 89 benchmark circuit show that the proposed technique can be applied to circuits of reasonable sizes within acceptable time．