A Thermal-Aware Parallel Multicast Testing Method Based on Many-Core Chips

The local overheating problem,which is referred to as hotspot,has become an important problem for parallel testing of many-core chips.This paper proposes a thermal-aware parallel multicast testing method to avoid hotspots.Firstly,we analyze the hotspots caused by parallel multicast test of many-core chips.Based on the above analysis,a heuristic algorithm is proposed to avoid hotspots during the generation of one multicast test access path.Finally,for further reducing the test time,we give an optimal solution of selecting candidate multicast test access paths which can coexist under the thermal constraints.Experimental results show that the hotspots can be eliminated,and the test time can be reduced by approximately 45 percent.