Zhao Zhenfeng, Li Xiaowei, Wu Liangzhi. ON THE ACCELERATION OF ROBUST TEST GENERATION FOR PATH DELAY FAULTSJ. Journal of Computer-Aided Design & Computer Graphics, 1996, 8(4): 288-294.
Citation:
Zhao Zhenfeng, Li Xiaowei, Wu Liangzhi. ON THE ACCELERATION OF ROBUST TEST GENERATION FOR PATH DELAY FAULTSJ. Journal of Computer-Aided Design & Computer Graphics, 1996, 8(4): 288-294.
Zhao Zhenfeng, Li Xiaowei, Wu Liangzhi. ON THE ACCELERATION OF ROBUST TEST GENERATION FOR PATH DELAY FAULTSJ. Journal of Computer-Aided Design & Computer Graphics, 1996, 8(4): 288-294.
Citation:
Zhao Zhenfeng, Li Xiaowei, Wu Liangzhi. ON THE ACCELERATION OF ROBUST TEST GENERATION FOR PATH DELAY FAULTSJ. Journal of Computer-Aided Design & Computer Graphics, 1996, 8(4): 288-294.
ON THE ACCELERATION OF ROBUST TEST GENERATION FOR PATH DELAY FAULTS
This article discusses how to generate robust tests for path delay faults by improving the matured test generation algorithm for stuck-at faults, according to the characteristics of path delay faults. This article defines the maximum input-value groups for one gate, develops the guidelines for the multiple backtrace procedure, improves path sensitization method, and discusses the direct processing for XOR/NXOR gates.
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