Li Xiaowei, Li Huawei, Luo Zuying, Min Yinghua. Reducing Power Dissipation During Delay Test ApplicationJ. Journal of Computer-Aided Design & Computer Graphics, 2002, 14(8): 738-742.
Citation:
Li Xiaowei, Li Huawei, Luo Zuying, Min Yinghua. Reducing Power Dissipation During Delay Test ApplicationJ. Journal of Computer-Aided Design & Computer Graphics, 2002, 14(8): 738-742.
Li Xiaowei, Li Huawei, Luo Zuying, Min Yinghua. Reducing Power Dissipation During Delay Test ApplicationJ. Journal of Computer-Aided Design & Computer Graphics, 2002, 14(8): 738-742.
Citation:
Li Xiaowei, Li Huawei, Luo Zuying, Min Yinghua. Reducing Power Dissipation During Delay Test ApplicationJ. Journal of Computer-Aided Design & Computer Graphics, 2002, 14(8): 738-742.
Reducing Power Dissipation During Delay Test Application
Re-ordering the test-pairs in the test sequences is introduced to minimize the switching activity of the circuit-under-test during test application．Hamming distance between test-pairs is used to guide their re-ordering． This guarantees a decrease in power dissipation without reducing the delay fault coverage．Experimental results are presented to demonstrate a 90% average reduction of the circuit activity for the test application．
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