A Testability Criterion in Nonlinear Analog Circuit

Testable topological structure and testable topological condition for branching diagnostic method are analyzed,testability analysis and testability design are presented.During testable design,the testability of single fault and mult-i faults in circuit can be judged by changing topological structure,numbers and location of accessible nodes.The method is applied to testability analysis in nonlinear analog circuit,an illustration validated this method.