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Zhang Rui, Jiang Jianhui, Lou Jungang, Shen Junhua, Wang Yanna. A B/S Structure based Test Platform for Embedded Systems and its ApplicationsJ. Journal of Computer-Aided Design & Computer Graphics, 2009, 21(1): 13-18,26.
Citation: Zhang Rui, Jiang Jianhui, Lou Jungang, Shen Junhua, Wang Yanna. A B/S Structure based Test Platform for Embedded Systems and its ApplicationsJ. Journal of Computer-Aided Design & Computer Graphics, 2009, 21(1): 13-18,26.

A B/S Structure based Test Platform for Embedded Systems and its Applications

  • To improve testing efficiency and accuracy,a B/S structure based test platform for embedded systems is proposed in the paper.Several test tools and analysis tools are integrated in the test server,and test agents are located at browsers.Based on the test platform,real-time performance,compatibility and robustness test schemes for embedded operating systems,and the functional and performance test schemes for embedded systems in the terminal equipments of automatic fare collection systems for Shanghai Metro are designed respectively.These test schemes are realized successfully on the test platform.A group of critical data is obtained,and it is useful for improvement of design for manufacturers and acceptance test for users.
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