Testing Inter-port Faults in Embedded Multi-Port SRAM

In order to detect inter-port faults in multi-port SRAM,this paper proposes a novel algorithm which is called w-r Algorithm and w-w Algorithm based on structural fault model.First,w-r Algorithm is improved from March C-Algorithm,its test addrest to the concurrent port should be addr±2 is demonstrated.Then,w-w Algorithm is proposed to detect the faults stimulated by concurrent writing（to different addrest）.In a word,it not only can detect traditional faults of single port but also can detect all inter-port faults,and it can deal with various SRAM of different line arrangement in the layout.Finally,Based on the experimental results on 64×8 bit double port SRAM,we conclude that it has 100% fault coverage with low time complexity.