He Xinhua, Gong Yunzhan, Lu Changling. STATE TEST GENERATION FOR SYNCHRONOUS CIRCUITSJ. Journal of Computer-Aided Design & Computer Graphics, 1997, 9(2): 175-181.
Citation:
He Xinhua, Gong Yunzhan, Lu Changling. STATE TEST GENERATION FOR SYNCHRONOUS CIRCUITSJ. Journal of Computer-Aided Design & Computer Graphics, 1997, 9(2): 175-181.
He Xinhua, Gong Yunzhan, Lu Changling. STATE TEST GENERATION FOR SYNCHRONOUS CIRCUITSJ. Journal of Computer-Aided Design & Computer Graphics, 1997, 9(2): 175-181.
Citation:
He Xinhua, Gong Yunzhan, Lu Changling. STATE TEST GENERATION FOR SYNCHRONOUS CIRCUITSJ. Journal of Computer-Aided Design & Computer Graphics, 1997, 9(2): 175-181.
Based on the character of stuck-up fault, this paper describes state transition testing algorithm. This approach involves state transition fault model and collapsing of fault set. In order to test the circuits that has not any reset state, special way for resolving start state is described. Finally. heuristic information that used testing process are proposed
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