Improving the Accuracy of Static Defect Detecting
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Graphical Abstract
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Abstract
False positive rate and false negative rate are key criteria of static defect detecting.Improving the analytic accuracy is the main method to reduce false positive and false negative.Defect pattern and its finite state machine description were introduced and then a defect detecting algorithm based on traditional dataflow analysis was presented.In order to realize path sensitive analysis,the dynamic information of program was represented approximately by abstract value of variables,and then infeasible path can be identified when some variable's abstract value is empty in the state condition.In order to realize context sensitive analysis,the context information of function call was represented using defect related function summary.A defect related function summary includes preconditions,postconditions and features.This method has been implemented in a defect detecting tool called DTS.Experimental results on ten open-source programs show that this method can reduce false positive and false negative.
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