MT Compacted Set for Interconnect Crosstalk on SoC

Multiple transition （MT ） fault model is an effective fault model for both the capacitive and inductive coupling induced faults on bus．But the previously generated test set based on MT fault model tends to be redundant．In this paper,cases of the pattern redundancy of the MT test set are analyzed and classified into three types．Euler loop is then used to compact MT test patterns and get optimized MT compacted set without losing fault coverage．Then,a self-testing program for MT fault model is developed to apply the MT compacted set to on-line at-speed detecting of crosstalk-induced faults．Experimental results on the system of network card show that the test time and pattern storage overhead can be significantly reduced with the MT compacted test set．