Test-Synthesis Method of Reversible Circuits Based on D Flip_Flop

A test-synthesis method of reversible circuits is proposed.Firstly,definition of measuring controllability and observability for reversible logic is given.Secondly,a new plan of Design-For-Test for reversible combinational and sequential circuits is worked out.Thirdly,a D Flip-Flops for reducing cost is built and a new scan-D Flip-Flops for constructing scan-chains is provided.Finally,utilizing the new scan-D Flip-Flops,a Test-Synthesis method for reversible circuits was presented.The proposed method was tested on a set of reversible benchmarks.In comparison with existing methods,costs increased less than 1 percent,while the improvement of testability has reached by 24 percent.