A Test Set Compression Algorithm Based on PTIDR Code

We present a new test data compression and decompression architecture based on a novel and efficient code, named PTIDR code. The proposed approach can acquire better compression efficiency than that of FDR (frequency-directed run-length), EFDR (extended FDR), alternating FDR etc. The decoder of PTIDR is also simpler, easier to realize and needs less hardware consumption. Compared with algorithms such as selective Huffman and CDCR (combining dictionary coding and LFSR reseeding), PTIDR can acquire higher CR/AR (ratio of compression ratio and area ratio). Especially, when the probability of 0s in the difference test set is greater than or equal to 0.7610, it can acquire better compression efficiency than FDR code, and thus, reducing the test cost of the chip.