Test Algorithm and Diagnosis Implementation for Embedded SRAM

This paper proposes an effective March 19N(N represents the address number of memory) test algorithm for an effectively detecting fault locations and identifying variety fault types which produces in the embedded static random access memory(SRAM),consequently improving the design and manufacture process of SRAM.Firstly,faults injection into a 64 × 8-bit SRAM;Secondly,read and write operations of the algorithm are translated into the states of controller,and then design a built-in self-test(BIST) with diagnostic support module;Finally,using the BIST module test the injection faults,then comparing and synthesizing the test data,in order to achieve faults testing and location.When analyzing simulation results,a fault dictionary is constructed for stuck-at fault,stuck-open fault,transition fault,inversion coupling fault,idempotent coupling fault,state coupling fault and address decoder fault.The fault dictionary shows that faults have different fault signature,similarly,it also shows that the algorithm has a completely diagnostic ratio.