Functional Testing of Microprocessors from Structural-Leve! Point of View

This paper presents a practical method of functional testing of micropr ocessors from Structural-level point of view. Users can sketch a functional block diagram of structural-level for testing by informations which may be obtained from microprocessor's manuals.Arithmetic units and their data-channels are main compo nents in the diagram.Test generation is based on it.The basic fault model is single detectable s.a.0( l ) fault.