Test Generation for Crosstalk-Induced Delay Faults

Crosstalk issues can cause logic errors as well as performance degradation,which should be addressed both in design phase and testing phase for deep submicron silicon.Longer paths tend to be sensitive to crosstalk-induced delay effects because of their short slack time.An automatic test pattern generation （ATPG） algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths.The algorithm is based on waveform sensitization.Experimental results show the proposed technique can be applied to circuits of reasonable sizes.