Liu Kun, Zheng Yun, Huang Daojun, Hou Jinsong. An Interconnect Delay Metric Based on the Rayleigh DistributionJ. Journal of Computer-Aided Design & Computer Graphics, 2005, 17(1): 119-121.
Citation:
Liu Kun, Zheng Yun, Huang Daojun, Hou Jinsong. An Interconnect Delay Metric Based on the Rayleigh DistributionJ. Journal of Computer-Aided Design & Computer Graphics, 2005, 17(1): 119-121.
Liu Kun, Zheng Yun, Huang Daojun, Hou Jinsong. An Interconnect Delay Metric Based on the Rayleigh DistributionJ. Journal of Computer-Aided Design & Computer Graphics, 2005, 17(1): 119-121.
Citation:
Liu Kun, Zheng Yun, Huang Daojun, Hou Jinsong. An Interconnect Delay Metric Based on the Rayleigh DistributionJ. Journal of Computer-Aided Design & Computer Graphics, 2005, 17(1): 119-121.
An Interconnect Delay Metric Based on the Rayleigh Distribution
From the point of view of statistical probability, this paper presents a novel and simple delay metric based on the Rayleigh distribution, called RLD (Rayleigh-based Delay). By this metric, only the first two moments are needed to estimate the interconnect delay. The results from RLD and the SPICE simulation results are almost the same, especially for the far-end nodes.
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