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Huang Zhengfeng, Guo Yang, Li Xueyun, Xu Qi, Song Tai, Qi Haochen, Ouyang Yiming, Ni Tianming. Single-Event Quadruple-Upset Self-Recoverable Latch Design[J]. Journal of Computer-Aided Design & Computer Graphics, 2021, 33(4): 632-639. DOI: 10.3724/SP.J.1089.2021.18573
Citation: Huang Zhengfeng, Guo Yang, Li Xueyun, Xu Qi, Song Tai, Qi Haochen, Ouyang Yiming, Ni Tianming. Single-Event Quadruple-Upset Self-Recoverable Latch Design[J]. Journal of Computer-Aided Design & Computer Graphics, 2021, 33(4): 632-639. DOI: 10.3724/SP.J.1089.2021.18573

Single-Event Quadruple-Upset Self-Recoverable Latch Design

  • For the sake of the requirement to tolerate increasingly serious single event multimode upset,a kind of radiation hardened latch which can tolerate single event quadruple node upset:QNURL(quadruple node upset recovery latch)is proposed.The QNURL consists of 40 isomorphic dual-input inverters,forming a 5×8 array structure,and constructing a fault-tolerant mechanism of multi-level filtering.The single-particle filtering characteristics of the dual input inverter are effectively utilized.When any 4 internal state nodes upset at the same time,they can be eliminated by the multi-level filtering mechanism and automatically restored to the correct value.The experimental results under the PTM 32 nm process show that compared with the existing four kinds of single event multimode up set radiation hardened latches,the single event quadruple node up set self recovery rate of the QNURL is as high as 100%,and the average delay is reduced by 86.02%.The average power delay product(PDP)is reduced by 78.94%.The average power consumption is increased by 59.09%,and the average area is increased by 4.63%.In this paper,the structure(N+1)×2N is derived,and also proposed a structure framework which can tolerant N-nodes upset.
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