Constraint Input Reduction BIST Scheme for Multiple Scan Chains

Constrained input reduction,LFSR coding and folding counter are applied to compress and generate a deterministic test set.Its highlight is effectively combining previous several test methods and taking full advantage of the methods in test data compression.Compared to international similar approaches, the proposed scheme needs less storage volume,can reduce testing time significantly,fully upgrade test performance,and is compatible with traditional scan-based design flow.