Abstract: Test configuration development is an essential step in FPGA test,to accelerate the development,a technique for FPGA test configuration analysis and evaluation based on configuration dictionary is presented in this paper.Firstly,the proposed method builds configuration dictionary of the basic programmable cells in FPGA,which contains all the configurations that the full test needs.Then the template method is used to analyze the test configuration and compute the coverage of the test configuration to the configuration dictionary.Experimental results show that the proposed method can perform exact evaluation to test configuration and report the detected and undetected FPGA resource of the test configuration.Compared with fault simulation method,it reduces time complexity from O(kpn²) to O(kn′) and is several orders of magnitude faster.Furthermore the operating time is independent of FPGA size.