Abstract: Module allocation in high level synthesis can influence register allocation scheme directly,and affect area,time delay,power consumption and testability as a result.So a testability-oriented module allocation method is given.After the module allocation rules which take the testability into consideration are given,a testability-oriented weighted graph model for module allocation is presented.Then the weighted graph based module allocation algorithm for improving testability is obtained.According to the biggest testability improvement rule,balanced module allocation scheme is given by modifying the weight dynamically.Experiments on benchmarks show that the algorithm in this paper gives a better testability than other schemes with less area overhead.