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增强组合电路脉冲窄化效应的软错误率优化布局方法

SER Optimization Detailed Placement Method by Pulse Quenching Enhancement

  • 摘要: 为了提高芯片抗辐照性能,提出了一种基于电荷共享效应的组合电路软错误率优化布局方法.首先减少已有quenching单元对间距以增强脉冲窄化效应;然后通过插入和交换操作增加电路中quenching单元对数量,以提高电路发生脉冲窄化效应的概率;最后实现了一个组合电路软错误率优化布局及评估平台,可自动地完成布局及软错误率评估.模拟结果表明,该方法可以减小最终被捕获的脉冲宽度,减少14%~26%的软错误率.

     

    Abstract: To improve anti-radiation performance, a soft-error optimal placement method for combinational circuits based on charge sharing is proposed. The algorithm enhanced the pulse quenching effect by reducing the distance between the existing quenching pairs. By inserting and reordering placement methods, the number of quenching pairs was increased, and the occurrence probability of pulse quenching effect was improved. A soft-error optimization placement and evaluation platform for combinational circuit was implemented. It could be used independently, or be embedded into commercial tools. The simulation results show that the method can reduce the pulse width that is eventually captured, and reduce soft errors by 14% ~26%.

     

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