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可复用微处理器片上调试功能的设计与实现

Design and Implementation of Reusable On-chip Debug Functions for Micro-processor

  • 摘要: 为了方便软件与应用系统的开发与调试,提出一种可复用的微处理器片上调试方法.通过设计通用的调试指令集和增加调试模块,并扩展处理器内核功能,实现了断点设置与取消、内核运行的流水级精确控制、内核资源访问、任意程序段运行中特殊事件的统计等片上调试功能.该方法已在自主研发的SuperV_EF01DSP上实现.在CMOS 90nm工艺下的综合结果表明,新增的片上调试功能不影响SuperV_EF01DSP的关键路径时序,而芯片总面积仅增加了3.87%.

     

    Abstract: In this paper,a reusable on-chip debug method for mirco-processors is proposed in order to facilitate software and application system developing and debugging.By employing a debug instruction set,adding a debug module and extending the functions of the processor,the following functions are implemented: setting and cancelling breakpoints;precisely run-time control of the pipeline-stage in the core;accessing the core resources;collecting the statistic of special events between any procedures of a program,etc.This method has been implemented on the independently designed SuperV_EF01 DSP.The synthesize results under CMOS 90nm process show that the chip area overhead of SuperV_EF01 DSP with the new on-chip debug features is 3.87%,and the critical path timing is not affected.

     

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