用于硬件模拟平台调试的低资源消耗扫描链插入方法
Resource Efficient Scan-Chain Insertion Approach for Debugging in Hardware Emulation Systems
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摘要: 为提高电路的调试性并降低逻辑资源消耗,提出一种用于硬件模拟平台的扫描链插入方法,利用FPGA中未被完全使用的逻辑资源实现了扫描逻辑.首先在网表中找出所有连接到D触发器输入端的部分使用查找表;然后采用逻辑混合的方法修改查找表内容和引脚连接,将D触发器改为扫描触发器;最后将所有扫描触发器前后相连,构建扫描链.该方法工作在网表级,与现有FPGA开发流程兼容,便于与现有工具集成.对15个不同规模ITC’99基准电路进行实验的结果表明,该方法可平均减小22.9%的逻辑资源消耗.Abstract: To improve circuit debuggability and reduce logic resource usage, this paper proposes an approach for scan chain insertion in hardware emulation platform, which exploits partially used look-up tables(LUTs) on FPGAs to realize the extra logic required by the scan chain. The approach firstly finds all partially used LUTs which are connected to the inputs of D flip-flops in a netlist. Secondly, the contents of the found LUTs are changed to accommodate the extra logic, in order to convert the D flip-flops to scan flip-flops. Finally, all scan flip-flops are connected to form the scan chain. The whole approach is automated and can be easily integrated into the current FPGA development flows. The experimental results on ITC’99 benchmark circuits show that the proposed approach can effectively reduce logic resource usage by 22.9% on average.